Low Temperature Fatigue Crack Growth Test and Life Estimation of 7475-T7351 Al-ally by ANN

J. R. Mohanty

Fatigue crack growth, Low temperature overload; Load ratio, Artificial neural network, Normalized mean square error.

In the present wok fatigue crack growth tests have been performed under interspersed mode-I overload on 7475-T7351 Al-alloy. The overloads with an overload ratio of 2 were given at 0ï‚°C, –30ï‚°C, –45ï‚°C, –60ï‚°C, and –75ï‚°C at a loading rate of 7 KN/min after the crack had grown to a/w ratio of 0.4. The crack growth tests have been continued in mode-I at a frequency of 5 Hz and load ratio (R) of 0.1 till fracture. From the fatigue tests it has been observed that the crack growth rate decreases and consequently fatigue life increases as the overload temperature decreases. The experimental data generated have been subsequently used to formulate the ANN model to predict the fatigue crack growth rates and the fatigue life of 7475-T7351 Al-alloy. It has been observed that the proposed model predicts the fatigue life with reasonable accuracy having + 0.919% deviation from experimental results.

10.22161/ijaers/3.12.48